Eric Krock
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Activity overview
Latest activity by Eric Krock-
Eric Krock created an article,
How Do Automated Shift Changes Work in ArchFX React?
Summary: When a shift scheduled in ArchFX Cloud ends, if a job is running or a downtime is in progress on the line or machine and there is another shift that immediately follows, ArchFX React will...
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Eric Krock created an article,
What's the difference between downtime and time lost?
"Downtime" and "Time Lost" measure different things and are easy to confuse, so we'll define them carefully and then illustrate with an example. "Downtime" (shown on the Performance Bar) measures ...
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Eric Krock created an article,
What are No Fault Found (NFF) Events and How is NFF % Calculated?
A NFF event occurs when a board (identified by serial number) is tested repeatedly and its final result is a "pass." Example: "fail then pass" Here is what one kind of NFF event looks like in the d...
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Eric Krock created an article,
Latency and Accuracy in Downtime Tracking Applications
ArchFX React accurately measures the percentage of downtime and idle time on machines and lines it is monitoring. Using React, manufacturers can identify underutilized assets and prioritize steps t...
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Eric Krock created an article,
Data to Submit with an ArchFX React Bug Report
Please submit as much of this data as possible with any ArchFX React bug reports to help us understand, reproduce, and isolate issues as quickly as possible. User First Name and Last Name or emai...
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Eric Krock created an article,
In-Circuit Test: Inspection Defect Trends (ICT)
The Inspection Defects Trends (ICT) Dashboard shows defect trends at the level of a selected In-Circuit Test machine. You can further filter defect trend information by Program(s) and Defect Type...
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Eric Krock created an article,
In-Circuit Test: Inspection Result Details (ICT)
The Inspection Results Details (ICT) Dashboard shows summary defect information at the level of a selected In-Circuit Test machine. Filters You use these filters to select which test results you wa...
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Eric Krock created an article,
In-Circuit Test: ICT Area Utilization
Filters You use these filters to select which test results you want to view: Site: Select the site you want to view. Area: Select the area you want to view. Remember to use the date picker in th...
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Eric Krock created an article,
In-Circuit Test: Machine-Level Basic Defects
The ICT Machine-Level Basic Defects Dashboard shows summary defect information at the level of a selected machine. Filters You use these filters to select which test results you want to view: Site...
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Eric Krock created an article,
In-Circuit Test: ICT Yield Overview
The ICT Yield Overview Dashboard measures yield across selected machine(s) at a site for selected program(s). It serves as a starting point for engineers and operators to identify problems of conce...