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Archsys.io
Real-Time Dashboards
In-Circuit Test
In-Circuit Test
In-Circuit Test: Inspection Defect Trends (ICT)
In-Circuit Test: Inspection Result Details (ICT)
In-Circuit Test: ICT Area Utilization
In-Circuit Test: Machine-Level Basic Defects
In-Circuit Test: ICT Yield Overview
In-Circuit Test: ICT Yield by Machine
